A novel technique for Interfacial Thermal Resistance measurement for nanoscale thin films
نویسندگان
چکیده
منابع مشابه
Controlling the thermal stability of thin films by interfacial engineering.
The quantized electronic structure in Pb films on Si(111) varies substantially as the film thickness increases. The changes in electronic energy cause the thermal stability of the films to oscillate with an approximate bilayer period. The phase of the oscillations can be controlled by interfacial engineering. Comparison of Pb films prepared on Si(111) terminated by In, Au, and Pb as interfactan...
متن کاملCadmium Oxide Thin Films Deposited by a Simplified Spray Pyrolysis Technique for Optoelectronic Applications
Cadmium oxide thin films were fabricated on glass substrates by a simplified and low cost spray pyrolysis technique at different substrate temperatures. The X-ray diffraction study showed that irrespective of substrate temperature all the films exhibits a preferential orientation along the (1 1 1) plane. The values of crystallite size were found to be in the range 20.72 – 29.6 nm. The perce...
متن کاملNote: Thermal analog to atomic force microscopy force-displacement measurements for nanoscale interfacial contact resistance.
Thermal diffusion measurements on polymethylmethacrylate-coated Si substrates using heated atomic force microscopy tips were performed to determine the contact resistance between an organic thin film and Si. The measurement methodology presented demonstrates how the thermal contrast signal obtained during a force-displacement ramp is used to quantify the resistance to heat transfer through an i...
متن کاملInterfacial toughness measurements for thin films on substrates
There are more than 200 different methods for measuring adhesion, suggesting it to be material, geometry and even industry specific. This availability has exploded at least partly due to the arrival of dissimilar material interfaces and thin films and the ease with which microfabrication techniques apply to silicon technology. Having an eye toward those tests utilized for thin films, this paper...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: International Journal of Heat and Mass Transfer
سال: 2015
ISSN: 0017-9310
DOI: 10.1016/j.ijheatmasstransfer.2015.05.088